Acta Stereologica

0351-580X

 

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Yrjö Collan, Erkki Oja & William F. Whimster

Mathematical background to stereology and morphometry for diagnostic pathologists

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Abstract

A short introduction to the basic mathematical principles which govern stereology and morphometry is given. The selection of principles introduced was chosen to cover the needs of a pathologist active in diagnostic histopathology. For one to get an overall picture of the fields of morphometry and stereology also and acquaintance with statistics of sampling and potential computer applications is necessary.

Para citar este artículo

Yrjö Collan, Erkki Oja & William F. Whimster, «Mathematical background to stereology and morphometry for diagnostic pathologists», Acta Stereologica [En ligne], Volume 2 (1983), Number 2 - Proceedings of the second symposium on morphometry in morphological diagnoses, september 7-9, 1983, Kuopio, Finland - Dec. 1983, 214-238 URL : https://popups.ulg.ac.be/0351-580x/index.php?id=4182.

Acerca de: Yrjö Collan

Department of Pathology, University of Kuopio, SF-70101 Kuopio, Finland

Acerca de: Erkki Oja

Department of Applied Mathematics, University of Kuopio, SF-70101 Kuopio, Finland

Acerca de: William F. Whimster

King's College Hospital Medical School, London, Great Britain