Acta Stereologica

0351-580X

 

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Shammi Rahangdale, Yan Ren, C.W. Hagen & P. Kruit

Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?

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Keywords : 2D and 3D image acquisition, MatLab and LabView, microscopic imaging and analysis

Pour citer cet article

Shammi Rahangdale, Yan Ren, C.W. Hagen & P. Kruit, «Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?», Acta Stereologica [En ligne], Proceedings ICSIA, 14th ICSIA abstracts, URL : https://popups.ulg.ac.be/0351-580x/index.php?id=3802.

A propos de : Shammi Rahangdale

Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands ; s.l.rahangdale@tudelft.nl

A propos de : Yan Ren

Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands

A propos de : C.W. Hagen

Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands

A propos de : P. Kruit

Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands